Agilent 5600LS AFM Atomic Force Microscope 8" 200mm Stage

Description

Agilent 5600LS AFM Atomic Force Microscope 8" 200mm Stage
Item was received as a part of excess inventory from local bio tech company, working order
here is description from manufacturer
Features and Benefits • Fully addressable and programmable 200 mm x 200 mm stage • Atomic-resolution imaging of a small sample area using AFM or STM scanners • Allows simple point-and-shoot AFM imaging based on optical view • Low-noise AFM design guarantees single atomic steps • Motorized optical focus provides excellent ease of use • Accurate location mapping (0.5 µm precision) ensures reproducibility Applications • Semiconductor: silicon wafers, devices • Data storage: CD, DVD, hard drive • Biological arrays • Polymers, materials science System Overview The Agilent 5600LS large-stage AFM is ready to deliver atomic-resolution results. The versatile 5600LS is the world’s only commercially available AFM that allows imaging of both large samples (in air) and small samples in air, or in liquid under temperature control with a 9 micron scanner. The 5600LS utilizes a fully addressable 200 mm x 200 mm stage and a new, low-noise AFM design. Samples up to 8” in diameter and 30 mm tall are easily accepted by the 200 mm vacuum chuck. The stage can accommodate a 300 mm wafer with repositioning. The 5600LS provides researchers a perfect tool for many nanotechnology applications, including semiconductor, materials science, and life science studies. Small Samples, Too The 5600LS system’s programmable, motorized stage enables fast, accurate probe positioning for imaging and mapping large and small specimens alike. Investigators can precisely locate and identify an area of interest and, with the coordinates stored, automatically reposition the sample quickly and accurately for further study. Multiple locations can be programmed into the system. For ultimate fl exibility, the stage can accommodate either a single large sample or up to nine small samples with vacuum chuck or more can be held with tape (each of whose locations can be programmed into the system). The 5600LS supports Agilent open-loop and closed-loop scanners as well as Agilent STM scanners for atomic resolution. To provide optimized scanning for a diverse set of applications, open-loop and closed-loop multipurpose scanners are available in two scan ranges. Agilent’s large scanner can scan areas up to 90 µm x 90 µm, whereas an easy switch to a 9 µm x 9 µm scanner or the 9 x 9 µm STM scanner lets 5600LS users image a very small sample area and see atomic steps. Furthermore, a special Agilent stage adapter permits the 5600LS to be utilized with a sample plate that facilitates imaging of small samples in liquid. Heating and cooling control is also offered for imaging biological and polymer samples in liquid.
Innovative Design The 5600LS combines stable, lownoise AFM imaging with high-speed, very fl at, easily reproducible displacement over the entire movement range. The automated tip approach feature of the Agilent atomic force microscope minimizes damage to delicate sample structures. Motorized optical zoom and focus capabilities facilitate the automatic pre-approach, simplifying setting the initial tip-sample separation. The 5600LS also allows researchers to perform simple, software-driven, point-and-shoot AFM imaging of an area of interest based on an optical view. AFM images can even be stitched together using Agilent’s Pico Image Advanced software package (optional). The 5600LS system includes a stage, an atomic force microscope, a scanner, a controller, and a computer. Imaging Modes The 5600LS is compatible with contact mode, acoustic AC mode, phase imaging, STM, LFM, EFM, MFM, force modulation, current sensing, and Agilent’s MAC Mode III — a gentle, nondestructive technique for imaging delicate samples in air and liquid. Patented MAC Mode III provides three user-confi gurable lock-in amplifi ers, affording researchers virtually limitless application possibilities and unprecedented speed. It also provides two expansion slots. MAC Mode III has been designed to allow single-pass imaging concurrent with KFM/EFM. Simultaneous, high-accuracy topography and surface potential measurements are enabled by a servo-on-height cantileve approach that is not susceptible to scanner drift. KFM/EFM is especially useful for measuring dielectric fi lms, metal surfaces, piezoelectrics, and conductor-insulator transitions. MAC Mode III also lets researchers perform vertical or lateral modulation studies and delivers a unique plot of the oscillating amplitude vs. frequency in contact. This capability allows easy optimization of the detection sensitivity for a broad range of cantilever spring constants. In addition to KFM/EFM and piezo force, MAC Mode III allows the use of higher resonance modes of the cantilever. Higher harmonic imaging provides contrast different from that seen with fundamental amplitude and phase signals. This technique can be utilized to collect additional information about mechanical properties of the sample surface.
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